FREQUENTLY ASKED QUESTIONS ABOUT ATOMIC FORCE MICROSCOPY (AFM FAQ)

AFM Artifacts

by Peter Eaton

Edge Overshoot


This artifact occurs when the scanner moves further than it should vertically, leading to a very "sharp" edge on the features in the image.
You can spot it in the topography profile as "bumps" on the edges of tall features.


How to avoid it.
If you scan more slowly, you will avoid this artifact. However, it is usually only noticable on samples that are very flat, with square features.

Artifacts Index Page




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This document was written by, and is maintained by Peter Eaton (peter.eaton@fc.up.pt)
Reproduction or distribution not allowed without my permission.
Please feel free to email me comments / questions / answers.
Document updated on 14th September 2007.